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Probes in HF metrology

Thesis (MScEng (Electrical and Electronic Engineering))--University of Stellenbosch, 2010.

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Main Author: Rossouw, Daniel Johannes
Other Authors: Reader, H. C.
Format: Thesis
Language:English
Published: Stellenbosch : University of Stellenbosch 2010
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access_status_str Open Access
author Rossouw, Daniel Johannes
author2 Reader, H. C.
author_browse Reader, H. C.
Rossouw, Daniel Johannes
author_facet Reader, H. C.
Rossouw, Daniel Johannes
author_sort Rossouw, Daniel Johannes
collection Thesis
dc_rights_str_mv University of Stellenbosch
description Thesis (MScEng (Electrical and Electronic Engineering))--University of Stellenbosch, 2010.
format Thesis
id oai:scholar.sun.ac.za:10019.1/5425
institution Stellenbosch University (South Africa)
language English
last_indexed 2026-06-10T12:43:06.958Z
license_str Other — see source repository
provenance_str_mv Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository
publishDate 2010
publishDateRange 2010
publishDateSort 2010
publisher Stellenbosch : University of Stellenbosch
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source_str SUNScholar — Stellenbosch University Repository
spelling oai:scholar.sun.ac.za:10019.1/5425 Probes in HF metrology Rossouw, Daniel Johannes Reader, H. C. University of Stellenbosch. Faculty of Engineering. Dept. of Electrical and Electronic Engineering. Coaxial Probe Mach-Zehnder probe E-field Dissertations -- Electronic engineering Theses -- Electronic engineering Metrology High frequency Thesis (MScEng (Electrical and Electronic Engineering))--University of Stellenbosch, 2010. ENGLISH ABSTRACT: Flanged coaxial probes are widely used to conduct accurate, broadband permittivity measurements of various dielectric materials. A metrology study, discussed in [1], revealed that small perturbations in measured permittivity data, are due to escaping common-mode (CM) current that propagates onto exposed VNA feed cabling. This is not considered in published permittivity extraction algorithms, like the National Institute of Standards and Technology (NIST) full-wave code that assumes an infinite flange radius. To characterise this effect we validate a finite volume time domain (FVTD) CST simulation model of an SMA coaxial probe, by probing sensitive E-fields in a metallic shielding cylinder, placed around it. For this process, electro-optic (EO) E-field sensors are considered and a Mach-Zehnder type sensor is designed. Manufacturing difficulties discontinues this approach, but the revisited extended centre conductor E-field probing technique proves successful. The technique entails a high dynamic range, two-port VNA measurement. Through CST we gain knowledge of the physics behind the CM-problem and the behaviour of fields around the coaxial probe. Different shielding environments are simulated to establish their ability to impede CM-current coupling onto measurement cabling. To study the CM-effect on extracted permittivity results, the investigation is extended to Short-Open-Load (SOL) calibrated face-plane measurements of dielectric solids. A CST model, which considers escaping CM-energy, is used to generate open circuit (OC) calibration coefficients and to serve as an independent extraction method. We inspect the effect of different shielding environments and through CST, extract accurate permittivity results for e00, to a degree not previously achieved for such systems. This allows comment on the infinite-flange-radius assumption of the NIST method and proves the significance of the CM-effect. AFRIKAANSE OPSOMMING: Geflensde koaksiale probes word algemeen in die praktyk gebruik om akkurate, wyeband permitiwiteitmetings van diëlektriese materiale te verrig. ’n Studie wat in [1] bespreek word, dui aan dat klein verskynsels in gemete resultate, verband hou met gemene-modus (GM) stroom, wat ontsnap en teenwoording is aan die buitekant van onbeskermde voerkabels. Hierdie verkynsel word nie deur huidige volgolf ekstraksie-algoaritmes, soos die van NIST wat ’n onëindige flensradius aanvaar, in ag geneem nie. Om die GM-effek te karakteriseer, verifieer ons ’n eindige-volume tyd-gebied CST simulasiemodel, deur sensitiewe metings binne ’n silidriese metaalskerm, wat om so ’n probe geplaas word. Vir hierdie meting word elektro-optiese E-veld probes eers oorweeg. In gevolg word ’n Mach-Zehnder-tipe probe ontwerp, maar vervaardigingsprobleme en tyd-oorwegings kniehalter hierdie benadering. Heroorweging van die verlengde koaksiale sentraalgeleier, E-veld-probe tegniek, wat hoë dinamiese bereik twee-poort netwerkanaliseerder metings behels, slaag uiteindelik in hierdie doel. CST maak dit nou moontlik om die GM stroomprobleem te simuleer en spesefieke veldgedrag te kan waarneem. Verskillende afskermingsmetodes se vermoë om GM-koppeling na kabels te beperk word ondersoek. Die GM studie word uitgebrei na SOL-gekalibreerde, flensvlakverwysde permitwiteitmetings van diëlektriese vastestowwe. ’n CST model, wat GM stroom in ag neem, word gebruik om oopgeslote kalibrasiekofisiënte te genereer en dien ook as ‘n alternatiewe permitiwiteit ekstraksiemetode. Die effek van die verskillende afskermingstegnieke word ondersoek en deur die CST metode te gebruik, word ’n aansienlike verbetering in akkuraatheid van e00 waardes verkry. Dit regverdig kommentaar oor die aannames wat in die NIST metode gemaak word en beklemtoon die belangrikheid om GM stroom in ag te neem. 2010-11-18T12:45:32Z 2010-12-15T10:44:31Z 2010-11-18T12:45:32Z 2010-12-15T10:44:31Z 2010-12 Thesis http://hdl.handle.net/10019.1/5425 en University of Stellenbosch 87 p. : ill. application/pdf Stellenbosch : University of Stellenbosch
spellingShingle Coaxial Probe
Mach-Zehnder probe
E-field
Dissertations -- Electronic engineering
Theses -- Electronic engineering
Metrology
High frequency
Rossouw, Daniel Johannes
Probes in HF metrology
title Probes in HF metrology
title_full Probes in HF metrology
title_fullStr Probes in HF metrology
title_full_unstemmed Probes in HF metrology
title_short Probes in HF metrology
title_sort probes in hf metrology
topic Coaxial Probe
Mach-Zehnder probe
E-field
Dissertations -- Electronic engineering
Theses -- Electronic engineering
Metrology
High frequency
url http://hdl.handle.net/10019.1/5425
work_keys_str_mv AT rossouwdanieljohannes probesinhfmetrology