Full Text Available

Note: Clicking the button above will open the full text document at the original institutional repository in a new window.

A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope

Thesis (Ph. D.) -- University of Stellenbosch, 1978.

Saved in:
Bibliographic Details
Main Author: Blum, F
Other Authors: Stellenbosch University. Faculty of . Dept. of .
Format: Thesis
Language:en_ZA
Published: Stellenbosch : Stellenbosch University 2012
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1867613773956644864
access_status_str Open Access
author Blum, F
author2 Stellenbosch University. Faculty of . Dept. of .
author_browse Blum, F
Stellenbosch University. Faculty of . Dept. of .
author_facet Stellenbosch University. Faculty of . Dept. of .
Blum, F
author_sort Blum, F
collection Thesis
dc_rights_str_mv Stellenbosch University
description Thesis (Ph. D.) -- University of Stellenbosch, 1978.
format Thesis
id oai:scholar.sun.ac.za:10019.1/57254
institution Stellenbosch University (South Africa)
language en_ZA
last_indexed 2026-06-10T12:41:28.315Z
license_str Other — see source repository
provenance_str_mv Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository
publishDate 2012
publishDateRange 2012
publishDateSort 2012
publisher Stellenbosch : Stellenbosch University
publisherStr Stellenbosch : Stellenbosch University
record_format dspace
source_str SUNScholar — Stellenbosch University Repository
spelling oai:scholar.sun.ac.za:10019.1/57254 A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope Blum, F Stellenbosch University. Faculty of . Dept. of . Chemistry, Analytic -- Qualitative Chemistry, Analytic -- Quantitative Scanning electron microscopes X-ray spectroscopy Dissertations -- Physics Thesis (Ph. D.) -- University of Stellenbosch, 1978. One copy microfiche. Full text to be digitised and attached to bibliographic record. 2012-08-27T11:38:23Z 2012-08-27T11:38:23Z 1978 Thesis http://hdl.handle.net/10019.1/57254 en_ZA Stellenbosch University 166 leaves : ill. Stellenbosch : Stellenbosch University
spellingShingle Chemistry, Analytic -- Qualitative
Chemistry, Analytic -- Quantitative
Scanning electron microscopes
X-ray spectroscopy
Dissertations -- Physics
Blum, F
A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
title A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
title_full A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
title_fullStr A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
title_full_unstemmed A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
title_short A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
title_sort critical evaluation of quantitative and qualitative analysis by means of energy dispersive x ray measurement in a scanning electron microscope
topic Chemistry, Analytic -- Qualitative
Chemistry, Analytic -- Quantitative
Scanning electron microscopes
X-ray spectroscopy
Dissertations -- Physics
url http://hdl.handle.net/10019.1/57254
work_keys_str_mv AT blumf acriticalevaluationofquantitativeandqualitativeanalysisbymeansofenergydispersivexraymeasurementinascanningelectronmicroscope
AT blumf criticalevaluationofquantitativeandqualitativeanalysisbymeansofenergydispersivexraymeasurementinascanningelectronmicroscope