Full Text Available

Note: Clicking the button above will open the full text document at the original institutional repository in a new window.

Aspects of electron microscopic characterisation of thin solid films

Thesis (M.Sc.) -- University of Stellenbosch, 1985.

Saved in:
Bibliographic Details
Main Author: Churms, C. L.(Cecil Lindsay)
Other Authors: Stellenbosch University. Faculty of . Dept. of .
Format: Thesis
Language:en_ZA
Published: Stellenbosch : Stellenbosch University 2012
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1867613939791036417
access_status_str Open Access
author Churms, C. L.(Cecil Lindsay)
author2 Stellenbosch University. Faculty of . Dept. of .
author_browse Churms, C. L.(Cecil Lindsay)
Stellenbosch University. Faculty of . Dept. of .
author_facet Stellenbosch University. Faculty of . Dept. of .
Churms, C. L.(Cecil Lindsay)
author_sort Churms, C. L.(Cecil Lindsay)
collection Thesis
dc_rights_str_mv Stellenbosch University
description Thesis (M.Sc.) -- University of Stellenbosch, 1985.
format Thesis
id oai:scholar.sun.ac.za:10019.1/57669
institution Stellenbosch University (South Africa)
language en_ZA
last_indexed 2026-06-10T12:44:06.995Z
license_str Other — see source repository
provenance_str_mv Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository
publishDate 2012
publishDateRange 2012
publishDateSort 2012
publisher Stellenbosch : Stellenbosch University
publisherStr Stellenbosch : Stellenbosch University
record_format dspace
source_str SUNScholar — Stellenbosch University Repository
spelling oai:scholar.sun.ac.za:10019.1/57669 Aspects of electron microscopic characterisation of thin solid films Churms, C. L.(Cecil Lindsay) Stellenbosch University. Faculty of . Dept. of . Thin films Electron microscopy Dissertations -- Physics Thesis (M.Sc.) -- University of Stellenbosch, 1985. Full text to be digitised and attached to bibliographic record. 2012-08-27T11:38:36Z 2012-08-27T11:38:36Z 1985 Thesis http://hdl.handle.net/10019.1/57669 en_ZA Stellenbosch University 1 v. : ill. Stellenbosch : Stellenbosch University
spellingShingle Thin films
Electron microscopy
Dissertations -- Physics
Churms, C. L.(Cecil Lindsay)
Aspects of electron microscopic characterisation of thin solid films
title Aspects of electron microscopic characterisation of thin solid films
title_full Aspects of electron microscopic characterisation of thin solid films
title_fullStr Aspects of electron microscopic characterisation of thin solid films
title_full_unstemmed Aspects of electron microscopic characterisation of thin solid films
title_short Aspects of electron microscopic characterisation of thin solid films
title_sort aspects of electron microscopic characterisation of thin solid films
topic Thin films
Electron microscopy
Dissertations -- Physics
url http://hdl.handle.net/10019.1/57669
work_keys_str_mv AT churmsclcecillindsay aspectsofelectronmicroscopiccharacterisationofthinsolidfilms