Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
Automatic background correction in atomic emission spectrometry by means of Fourier analysis
Thesis (M. Sc.) -- University of Stellenbosch, 1990.
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | en_ZA |
| Published: |
Stellenbosch : Stellenbosch University
2012
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
| _version_ | 1867614113824243712 |
|---|---|
| access_status_str | Open Access |
| author | Matthee, Theunis |
| author2 | Stellenbosch University. Faculty of . Dept. of . |
| author_browse | Matthee, Theunis Stellenbosch University. Faculty of . Dept. of . |
| author_facet | Stellenbosch University. Faculty of . Dept. of . Matthee, Theunis |
| author_sort | Matthee, Theunis |
| collection | Thesis |
| dc_rights_str_mv | Stellenbosch University |
| description | Thesis (M. Sc.) -- University of Stellenbosch, 1990. |
| format | Thesis |
| id | oai:scholar.sun.ac.za:10019.1/68675 |
| institution | Stellenbosch University (South Africa) |
| language | en_ZA |
| last_indexed | 2026-06-10T12:46:52.985Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository |
| publishDate | 2012 |
| publishDateRange | 2012 |
| publishDateSort | 2012 |
| publisher | Stellenbosch : Stellenbosch University |
| publisherStr | Stellenbosch : Stellenbosch University |
| record_format | dspace |
| source_str | SUNScholar — Stellenbosch University Repository |
| spelling | oai:scholar.sun.ac.za:10019.1/68675 Automatic background correction in atomic emission spectrometry by means of Fourier analysis Matthee, Theunis Stellenbosch University. Faculty of . Dept. of . Atomic spectra -- Measurements Fourier analysis Atomic emission spectroscopy Dissertations -- Physics Thesis (M. Sc.) -- University of Stellenbosch, 1990. Full text to be digitised and attached to bibliographic record. 2012-08-27T12:26:42Z 2012-08-27T12:26:42Z 1990 Thesis http://hdl.handle.net/10019.1/68675 en_ZA Stellenbosch University 181 leaves : ill. Stellenbosch : Stellenbosch University |
| spellingShingle | Atomic spectra -- Measurements Fourier analysis Atomic emission spectroscopy Dissertations -- Physics Matthee, Theunis Automatic background correction in atomic emission spectrometry by means of Fourier analysis |
| title | Automatic background correction in atomic emission spectrometry by means of Fourier analysis |
| title_full | Automatic background correction in atomic emission spectrometry by means of Fourier analysis |
| title_fullStr | Automatic background correction in atomic emission spectrometry by means of Fourier analysis |
| title_full_unstemmed | Automatic background correction in atomic emission spectrometry by means of Fourier analysis |
| title_short | Automatic background correction in atomic emission spectrometry by means of Fourier analysis |
| title_sort | automatic background correction in atomic emission spectrometry by means of fourier analysis |
| topic | Atomic spectra -- Measurements Fourier analysis Atomic emission spectroscopy Dissertations -- Physics |
| url | http://hdl.handle.net/10019.1/68675 |
| work_keys_str_mv | AT mattheetheunis automaticbackgroundcorrectioninatomicemissionspectrometrybymeansoffourieranalysis |