Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering
Saved in:
| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
| _version_ | 1871740947737346048 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:106771 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| last_indexed | 2026-07-26T02:01:08.348Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering |
| title_auth | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering |
| title_full | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering |
| title_fullStr | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering |
| title_full_unstemmed | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering |
| title_short | FDSOI-Based Cryogenic Circuit Performance Enhancement Using Back-Biasing and Threshold Voltage Engineering |
| title_sort | fdsoi-based cryogenic circuit performance enhancement using back-biasing and threshold voltage engineering |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11513225 |