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Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge

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Published in:Modern Electronic Materials
Format: Online Article RSS Article
Published: 2025
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_version_ 1864030189077397507
collection WordPress RSS
FRELIP Feed Integration
container_title Modern Electronic Materials
description
discipline_display Technology & Engineering
discipline_facet Technology & Engineering
format Online Article
RSS Article
genre Journal Article
id rss_article:12717
institution FRELIP
journal_source_facet Modern Electronic Materials
publishDate 2025
publishDateSort 2025
record_format rss_article
spellingShingle Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
Manufacturing and Technology
Technology & Engineering — Computing
Technology & Engineering
sub_discipline_display Technology & Engineering — Computing
sub_discipline_facet Technology & Engineering — Computing
subject_display Manufacturing and Technology
Technology & Engineering — Computing
Technology & Engineering
Manufacturing and Technology
Technology & Engineering — Computing
Technology & Engineering
subject_facet Manufacturing and Technology
Technology & Engineering — Computing
Technology & Engineering
title Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
title_auth Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
title_full Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
title_fullStr Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
title_full_unstemmed Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
title_short Evaluating the effects of doping dynamics to unveiling the GaN MOSFET edge
title_sort evaluating the effects of doping dynamics to unveiling the gan mosfet edge
topic Manufacturing and Technology
Technology & Engineering — Computing
Technology & Engineering
url https://moem.pensoft.net/article/137432/