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Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures
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| Published in: | Modern Electronic Materials |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2022
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| Subjects: | |
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| _version_ | 1864030187927109634 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | Modern Electronic Materials |
| description | |
| discipline_display | Technology & Engineering |
| discipline_facet | Technology & Engineering |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:12791 |
| institution | FRELIP |
| journal_source_facet | Modern Electronic Materials |
| publishDate | 2022 |
| publishDateSort | 2022 |
| record_format | rss_article |
| spellingShingle | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures Manufacturing and Technology Technology & Engineering — Computing Technology & Engineering |
| sub_discipline_display | Technology & Engineering — Computing |
| sub_discipline_facet | Technology & Engineering — Computing |
| subject_display | Manufacturing and Technology Technology & Engineering — Computing Technology & Engineering Manufacturing and Technology Technology & Engineering — Computing Technology & Engineering |
| subject_facet | Manufacturing and Technology Technology & Engineering — Computing Technology & Engineering |
| title | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| title_auth | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| title_full | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| title_fullStr | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| title_full_unstemmed | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| title_short | Multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| title_sort | multi-angle spectrophotometry as a tool for determination of film parameters on single-layer structures |
| topic | Manufacturing and Technology Technology & Engineering — Computing Technology & Engineering |
| url | https://moem.pensoft.net/article/84239/ |