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Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography

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Bibliographic Details
Published in:Electronics Letters
Format: Online Article RSS Article
Published: 2026
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container_title Electronics Letters
description
discipline_display Technology & Engineering
discipline_facet Technology & Engineering
format Online Article
RSS Article
genre Journal Article
id rss_article:31094
institution FRELIP
journal_source_facet Electronics Letters
publishDate 2026
publishDateSort 2026
record_format rss_article
spellingShingle Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
Electronics
Technology & Engineering — Aerospace & Applied Tech
Technology & Engineering
sub_discipline_display Technology & Engineering — Aerospace & Applied Tech
sub_discipline_facet Technology & Engineering — Aerospace & Applied Tech
subject_display Electronics
Technology & Engineering — Aerospace & Applied Tech
Technology & Engineering
Electronics
Technology & Engineering — Aerospace & Applied Tech
Technology & Engineering
subject_facet Electronics
Technology & Engineering — Aerospace & Applied Tech
Technology & Engineering
title Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
title_auth Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
title_full Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
title_fullStr Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
title_full_unstemmed Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
title_short Dispersion Measurement of Semiconductor Lasers Using Low‐Coherence Holography
title_sort dispersion measurement of semiconductor lasers using low‐coherence holography
topic Electronics
Technology & Engineering — Aerospace & Applied Tech
Technology & Engineering
url https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/ell2.70547?af=R