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Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector

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Published in:IEEE Access
Format: Online Article RSS Article
Published: 2026
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container_title IEEE Access
description
discipline_display Technology & Engineering
discipline_facet Technology & Engineering
format Online Article
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genre Journal Article
id rss_article:45779
institution FRELIP
journal_source_facet IEEE Access
publishDate 2026
publishDateSort 2026
record_format rss_article
spellingShingle Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
Computer Sciience
Technology & Engineering — Computing
Technology & Engineering
sub_discipline_display Technology & Engineering — Computing
sub_discipline_facet Technology & Engineering — Computing
subject_display Computer Sciience
Technology & Engineering — Computing
Technology & Engineering
Computer Sciience
Technology & Engineering — Computing
Technology & Engineering
subject_facet Computer Sciience
Technology & Engineering — Computing
Technology & Engineering
title Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
title_auth Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
title_full Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
title_fullStr Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
title_full_unstemmed Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
title_short Insertion-Withdrawal, Contact Behavior, and Temperature Rise of a Cantilevered Reed-Type Electrical Connector
title_sort insertion-withdrawal, contact behavior, and temperature rise of a cantilevered reed-type electrical connector
topic Computer Sciience
Technology & Engineering — Computing
Technology & Engineering
url http://ieeexplore.ieee.org/document/11483158