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Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2025
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| Subjects: | |
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| _version_ | 1868553174390931456 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:74167 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| last_indexed | 2026-06-20T21:31:51.751Z |
| publishDate | 2025 |
| publishDateSort | 2025 |
| record_format | rss_article |
| spellingShingle | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights |
| title_alt | Fiabilidad de HEMTs de AlScN/GaN bajo mediciones pulsadas y pruebas de estrés por pasos HTRB: perspectivas experimentales y TCAD Fiabilité des HEMTs AlScN/GaN sous mesures pulsées et tests de stress par paliers HTRB : aperçus expérimentaux et TCAD Confiabilidade de HEMTs AlScN/GaN sob Medidas Pulsadas e Testes de Estresse HTRB: Insights Experimentais e TCAD |
| title_auth | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights |
| title_es_txt | Fiabilidad de HEMTs de AlScN/GaN bajo mediciones pulsadas y pruebas de estrés por pasos HTRB: perspectivas experimentales y TCAD |
| title_fr_txt | Fiabilité des HEMTs AlScN/GaN sous mesures pulsées et tests de stress par paliers HTRB : aperçus expérimentaux et TCAD |
| title_full | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights |
| title_fullStr | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights |
| title_full_unstemmed | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights |
| title_pt_txt | Confiabilidade de HEMTs AlScN/GaN sob Medidas Pulsadas e Testes de Estresse HTRB: Insights Experimentais e TCAD |
| title_short | Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights |
| title_sort | reliability of alscn/gan hemts under pulsed measurements and htrb step-stress tests: experimental and tcad insights |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11282436 |