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Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1868553174499983360 |
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| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:74172 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| last_indexed | 2026-06-20T21:31:51.751Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis |
| title_alt | Investigación de mecanismos de degradación inducidos por PBTS en TFTs IGZO coplanares SA TG mediante análisis de ruido de baja frecuencia Étude des mécanismes de dégradation induits par PBTS dans les TFTs IGZO coplanaires SA TG par analyse du bruit basse fréquence Investigação de Mecanismos de Degradação Induzidos por PBTS em TFTs IGZO Coplanares SA TG Usando Análise de Ruído de Baixa Frequência |
| title_auth | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis |
| title_es_txt | Investigación de mecanismos de degradación inducidos por PBTS en TFTs IGZO coplanares SA TG mediante análisis de ruido de baja frecuencia |
| title_fr_txt | Étude des mécanismes de dégradation induits par PBTS dans les TFTs IGZO coplanaires SA TG par analyse du bruit basse fréquence |
| title_full | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis |
| title_fullStr | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis |
| title_full_unstemmed | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis |
| title_pt_txt | Investigação de Mecanismos de Degradação Induzidos por PBTS em TFTs IGZO Coplanares SA TG Usando Análise de Ruído de Baixa Frequência |
| title_short | Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis |
| title_sort | investigation of pbts-induced degradation mechanisms in sa tg coplanar igzo tfts using low-frequency noise analysis |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11347528 |