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Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1867301674434953216 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:74176 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress |
| title_auth | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress |
| title_full | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress |
| title_fullStr | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress |
| title_full_unstemmed | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress |
| title_short | Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress |
| title_sort | research on degradation of p-finfet under mixed nbti and hcd stress |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11347527 |