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Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity

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Bibliographic Details
Published in:IEEE Journal of the Electron Devices Society
Format: Online Article RSS Article
Published: 2026
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container_title IEEE Journal of the Electron Devices Society
description
discipline_display Electronics
discipline_facet Electronics
format Online Article
RSS Article
genre Journal Article
id rss_article:74179
institution FRELIP
journal_source_facet IEEE Journal of the Electron Devices Society
last_indexed 2026-06-20T21:35:10.452Z
publishDate 2026
publishDateSort 2026
record_format rss_article
spellingShingle Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
Electronics
General
Electronics
sub_discipline_display General
sub_discipline_facet General
subject_display Electronics
General
Electronics
subject_facet Electronics
General
Electronics
title Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
title_alt Estudio de simulación sobre la escalabilidad de transistores de efecto de campo reconfigurables de canal envolvente con polaridad controlada por puerta
Étude de simulation sur l'évolutivité des transistors à effet de champ reconfigurables à canal tout autour avec polarité contrôlée par grille
Estudo de simulação sobre a escalabilidade de transistores de efeito de campo reconfiguráveis com canal ao redor e polaridade controlada por porta
title_auth Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
title_es_txt Estudio de simulación sobre la escalabilidad de transistores de efecto de campo reconfigurables de canal envolvente con polaridad controlada por puerta
title_fr_txt Étude de simulation sur l'évolutivité des transistors à effet de champ reconfigurables à canal tout autour avec polarité contrôlée par grille
title_full Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
title_fullStr Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
title_full_unstemmed Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
title_pt_txt Estudo de simulação sobre a escalabilidade de transistores de efeito de campo reconfiguráveis com canal ao redor e polaridade controlada por porta
title_short Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
title_sort simulation study on the scalability of channel-all-around reconfigurable field-effect transistors with gate-controlled polarity
topic Electronics
General
Electronics
url http://ieeexplore.ieee.org/document/11367430