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Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1868553326329593857 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:74185 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| last_indexed | 2026-06-20T21:35:10.452Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method |
| title_alt | Evaluación de trampas de interfaz dentro de la región de deriva en LDMOS usando un método de prueba de múltiples pulsos Évaluation des pièges d'interface dans la région de dérive d'un LDMOS à l'aide d'une méthode de test multi-impulsions Avaliação de armadilhas de interface dentro da região de deriva em LDMOS usando um método de teste de múltiplos pulsos |
| title_auth | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method |
| title_es_txt | Evaluación de trampas de interfaz dentro de la región de deriva en LDMOS usando un método de prueba de múltiples pulsos |
| title_fr_txt | Évaluation des pièges d'interface dans la région de dérive d'un LDMOS à l'aide d'une méthode de test multi-impulsions |
| title_full | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method |
| title_fullStr | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method |
| title_full_unstemmed | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method |
| title_pt_txt | Avaliação de armadilhas de interface dentro da região de deriva em LDMOS usando um método de teste de múltiplos pulsos |
| title_short | Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method |
| title_sort | evaluation of interface traps within drift region in ldmos using a multi-pulse test method |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11372746 |