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Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1868553327167406080 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Electronics |
| discipline_facet | Electronics |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:74188 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| last_indexed | 2026-06-20T21:35:10.452Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process Electronics General Electronics |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Electronics General Electronics |
| subject_facet | Electronics General Electronics |
| title | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process |
| title_alt | Medición y análisis de transistores ferroeléctricos multiestado en proceso CMOS de 28 nm Mesure et analyse de transistors ferroélectriques multi-états dans un processus CMOS 28 nm Medição e análise de transistores ferroelétricos multiestado em processo CMOS de 28 nm |
| title_auth | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process |
| title_es_txt | Medición y análisis de transistores ferroeléctricos multiestado en proceso CMOS de 28 nm |
| title_fr_txt | Mesure et analyse de transistors ferroélectriques multi-états dans un processus CMOS 28 nm |
| title_full | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process |
| title_fullStr | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process |
| title_full_unstemmed | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process |
| title_pt_txt | Medição e análise de transistores ferroelétricos multiestado em processo CMOS de 28 nm |
| title_short | Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process |
| title_sort | measurement and analysis of multistate ferroelectric transistors in 28 nm cmos process |
| topic | Electronics General Electronics |
| url | http://ieeexplore.ieee.org/document/11395490 |