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Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis

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Published in:IEEE Access
Format: Online Article RSS Article
Published: 2026
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discipline_display Engineering & Technology
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format Online Article
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publishDateSort 2026
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spellingShingle Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
Computer Science & Information Science
Computer Science & IT
Engineering & Technology
sub_discipline_display Computer Science & IT
sub_discipline_facet Computer Science & IT
subject_display Computer Science & Information Science
Computer Science & IT
Engineering & Technology
Computer Science & Information Science
Computer Science & IT
Engineering & Technology
subject_facet Computer Science & Information Science
Computer Science & IT
Engineering & Technology
title Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
title_auth Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
title_full Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
title_fullStr Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
title_full_unstemmed Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
title_short Benchmarking TabNet, NODE, and FT-Transformer for Software Defect Prediction: An Empirical Comparison and Explainability Analysis
title_sort benchmarking tabnet, node, and ft-transformer for software defect prediction: an empirical comparison and explainability analysis
topic Computer Science & Information Science
Computer Science & IT
Engineering & Technology
url http://ieeexplore.ieee.org/document/11359143