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Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits

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Bibliographic Details
Published in:VLSI Design
Format: Online Article RSS Article
Published: 2016
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FRELIP Feed Integration
container_title VLSI Design
description
discipline_display Computer Science
discipline_facet Computer Science
format Online Article
RSS Article
genre Journal Article
id rss_article:78829
institution FRELIP
journal_source_facet VLSI Design
publishDate 2016
publishDateSort 2016
record_format rss_article
spellingShingle Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
Computer Science
General
Computer Science
sub_discipline_display General
sub_discipline_facet General
subject_display Computer Science
General
Computer Science
Computer Science
General
Computer Science
subject_facet Computer Science
General
Computer Science
title Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
title_auth Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
title_full Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
title_fullStr Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
title_full_unstemmed Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
title_short Implementation, Test Pattern Generation, and Comparative Analysis of Different Adder Circuits
title_sort implementation, test pattern generation, and comparative analysis of different adder circuits
topic Computer Science
General
Computer Science
url https://www.hindawi.com/journals/vlsi/2016/1260879/