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HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation

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Published in:IEEE Access
Format: Online Article RSS Article
Published: 2026
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container_title IEEE Access
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discipline_display Engineering & Technology
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journal_source_facet IEEE Access
publishDate 2026
publishDateSort 2026
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spellingShingle HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
Computer Science & Information Science
Computer Science & IT
Engineering & Technology
sub_discipline_display Computer Science & IT
sub_discipline_facet Computer Science & IT
subject_display Computer Science & Information Science
Computer Science & IT
Engineering & Technology
Computer Science & Information Science
Computer Science & IT
Engineering & Technology
subject_facet Computer Science & Information Science
Computer Science & IT
Engineering & Technology
title HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
title_auth HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
title_full HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
title_fullStr HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
title_full_unstemmed HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
title_short HOS: A Hybrid Metaheuristic One-Parameter-at-a-Time Strategy for T-Way Test Case Generation
title_sort hos: a hybrid metaheuristic one-parameter-at-a-time strategy for t-way test case generation
topic Computer Science & Information Science
Computer Science & IT
Engineering & Technology
url http://ieeexplore.ieee.org/document/11406115