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Buffered Bounded Transparent Scan for Test Generation
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| Published in: | IEEE Access |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
| Tags: |
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| _version_ | 1869482244055236608 |
|---|---|
| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Access |
| description | |
| discipline_display | Computer Sciience |
| discipline_facet | Computer Sciience |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:97953 |
| institution | FRELIP |
| journal_source_facet | IEEE Access |
| last_indexed | 2026-07-01T03:39:58.445Z |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Buffered Bounded Transparent Scan for Test Generation Computer Sciience General Computer Sciience |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Computer Sciience General Computer Sciience |
| subject_facet | Computer Sciience General Computer Sciience |
| title | Buffered Bounded Transparent Scan for Test Generation |
| title_alt | Escaneo transparente acotado con búfer para generación de pruebas Scan transparent tamponné et borné pour la génération de tests Varredura Transparente Limitada com Buffer para Geração de Testes |
| title_auth | Buffered Bounded Transparent Scan for Test Generation |
| title_es_txt | Escaneo transparente acotado con búfer para generación de pruebas |
| title_fr_txt | Scan transparent tamponné et borné pour la génération de tests |
| title_full | Buffered Bounded Transparent Scan for Test Generation |
| title_fullStr | Buffered Bounded Transparent Scan for Test Generation |
| title_full_unstemmed | Buffered Bounded Transparent Scan for Test Generation |
| title_pt_txt | Varredura Transparente Limitada com Buffer para Geração de Testes |
| title_short | Buffered Bounded Transparent Scan for Test Generation |
| title_sort | buffered bounded transparent scan for test generation |
| topic | Computer Sciience General Computer Sciience |
| url | http://ieeexplore.ieee.org/document/11573958 |