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Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA
A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA...
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| Format: | Thesis |
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AUC Knowledge Fountain
2015
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| _version_ | 1867613408411516928 |
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| access_status_str | Open Access |
| author | Ammar, Adel |
| author_browse | Ammar, Adel |
| author_facet | Ammar, Adel |
| author_sort | Ammar, Adel |
| collection | Thesis |
| dc_rights_str_mv | The author retains all rights with regard to copyright. The author certifies that written permission from the owner(s) of third-party copyrighted matter included in the thesis, dissertation, paper, or record of study has been obtained. The author further certifies that IRB approval has been obtained for this thesis, or that IRB approval is not necessary for this thesis. Insofar as this thesis, dissertation, paper, or record of study is an educational record as defined in the Family Educational Rights and Privacy Act (FERPA) (20 USC 1232g), the author has granted consent to disclosure of it to anyone who requests a copy. |
| description | A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA) by a total-ionizing dose. It then identified the different factors contributing to the amount of delay induced by the total dose in the FPGA. A novel fault model for delay failure in FPGA was developed. This fault model was used to identify worst-case test vectors for delay failures induced in FPGA devices exposed to a total ionizing dose. The fault model and the methodology for identifying worst-case test vectors WCTV were validated using Micro-semi ProASIC3 FPGA and Cobalt 60 radiation facility. |
| format | Thesis |
| id | oai:fount.aucegypt.edu:etds-1227 |
| institution | American University in Cairo (Egypt) |
| last_indexed | 2026-06-10T12:35:39.635Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from AUC Knowledge Fountain — bepress |
| publishDate | 2015 |
| publishDateRange | 2015 |
| publishDateSort | 2015 |
| publisher | AUC Knowledge Fountain |
| publisherStr | AUC Knowledge Fountain |
| record_format | dspace |
| source_str | AUC Knowledge Fountain — bepress |
| spelling | oai:fount.aucegypt.edu:etds-1227 Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA Ammar, Adel A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA) by a total-ionizing dose. It then identified the different factors contributing to the amount of delay induced by the total dose in the FPGA. A novel fault model for delay failure in FPGA was developed. This fault model was used to identify worst-case test vectors for delay failures induced in FPGA devices exposed to a total ionizing dose. The fault model and the methodology for identifying worst-case test vectors WCTV were validated using Micro-semi ProASIC3 FPGA and Cobalt 60 radiation facility. 2015-02-01T08:00:00Z thesis application/pdf https://fount.aucegypt.edu/etds/228 https://fount.aucegypt.edu/context/etds/article/1227/viewcontent/Adel_20thesis_20final.pdf The author retains all rights with regard to copyright. The author certifies that written permission from the owner(s) of third-party copyrighted matter included in the thesis, dissertation, paper, or record of study has been obtained. The author further certifies that IRB approval has been obtained for this thesis, or that IRB approval is not necessary for this thesis. Insofar as this thesis, dissertation, paper, or record of study is an educational record as defined in the Family Educational Rights and Privacy Act (FERPA) (20 USC 1232g), the author has granted consent to disclosure of it to anyone who requests a copy. Theses and Dissertations AUC Knowledge Fountain FPGA radiation |
| spellingShingle | FPGA radiation Ammar, Adel Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA |
| title | Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA |
| title_full | Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA |
| title_fullStr | Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA |
| title_full_unstemmed | Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA |
| title_short | Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA |
| title_sort | identifying worst case test vectors for delay failures induced by total dose in flash based fpga |
| topic | FPGA radiation |
| url | https://fount.aucegypt.edu/etds/228 https://fount.aucegypt.edu/context/etds/article/1227/viewcontent/Adel_20thesis_20final.pdf |
| work_keys_str_mv | AT ammaradel identifyingworstcasetestvectorsfordelayfailuresinducedbytotaldoseinflashbasedfpga |