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Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA
A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA...
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AUC Knowledge Fountain
2015
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