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Macro-model of through silicon vias (tsvs) arrays

As continued scaling down of transistors becomes increasingly difficult due to physical and technical issues like the increase of leakage power and total power consumption, overall, 3D integration is now considered a viable solution to get a higher bandwidth and power efficiency. Use of Through-sili...

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Bibliographic Details
Main Author: Ahmed, Karim
Format: Thesis
Published: AUC Knowledge Fountain 2013
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