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Developing a test suite to aid in single event effect testing of ARM microcontrollers

Thesis (MEng)--Stellenbosch University, 2021.

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Bibliographic Details
Main Author: Sciocatti, Victor J.
Other Authors: Barnard, Arno
Format: Thesis
Language:en_ZA
Published: Stellenbosch : Stellenbosch University 2021
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