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On-edge assembly defect detection in noisy environments using convolutional neural networks
Smit, J. 2025. On-Edge Assembly Defect Detection in Noisy Environments using Convolutional Neural Networks. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/07ed5803-7c34-4d1f-add1-9430dd0a134c
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| Language: | English |
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Stellenbosch : Stellenbosch University
2025
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