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Skripsie (M. Sc.) -- Universiteit van Stellenbosch, 1972.
| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | af_ZA |
| Published: |
Stellenbosch : Stellenbosch University
2012
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| _version_ | 1867613890709291009 |
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| access_status_str | Open Access |
| author | Knoesen, Dirk |
| author2 | Stellenbosch University. Faculty of . Dept. of . |
| author_browse | Knoesen, Dirk Stellenbosch University. Faculty of . Dept. of . |
| author_facet | Stellenbosch University. Faculty of . Dept. of . Knoesen, Dirk |
| author_sort | Knoesen, Dirk |
| collection | Thesis |
| dc_rights_str_mv | Stellenbosch University |
| description | Skripsie (M. Sc.) -- Universiteit van Stellenbosch, 1972. |
| format | Thesis |
| id | oai:scholar.sun.ac.za:10019.1/57029 |
| institution | Stellenbosch University (South Africa) |
| language | af_ZA |
| last_indexed | 2026-06-10T12:43:20.403Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository |
| publishDate | 2012 |
| publishDateRange | 2012 |
| publishDateSort | 2012 |
| publisher | Stellenbosch : Stellenbosch University |
| publisherStr | Stellenbosch : Stellenbosch University |
| record_format | dspace |
| source_str | SUNScholar — Stellenbosch University Repository |
| spelling | oai:scholar.sun.ac.za:10019.1/57029 Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. Knoesen, Dirk Stellenbosch University. Faculty of . Dept. of . Electrons -- Diffraction Dissertations -- Physics Skripsie (M. Sc.) -- Universiteit van Stellenbosch, 1972. In title the [percent] is the symbol. Full text to be digitised and attached to bibliographic record. 2012-08-27T11:38:16Z 2012-08-27T11:38:16Z 1972 Thesis http://hdl.handle.net/10019.1/57029 af_ZA Stellenbosch University 65 p. : ill. Stellenbosch : Stellenbosch University |
| spellingShingle | Electrons -- Diffraction Dissertations -- Physics Knoesen, Dirk Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. |
| title | Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. |
| title_full | Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. |
| title_fullStr | Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. |
| title_full_unstemmed | Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. |
| title_short | Elektrondiffraksietegnieke met behulp van die elektronmikroskoop : 'n studie van sekondere defekte in Al-0.5 [percent] Mg. |
| title_sort | elektrondiffraksietegnieke met behulp van die elektronmikroskoop n studie van sekondere defekte in al 0 5 percent mg |
| topic | Electrons -- Diffraction Dissertations -- Physics |
| url | http://hdl.handle.net/10019.1/57029 |
| work_keys_str_mv | AT knoesendirk elektrondiffraksietegniekemetbehulpvandieelektronmikroskoopnstudievansekonderedefekteinal05percentmg |