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A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention
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| Published in: | PLOS ONE |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1864030192322740224 |
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| collection | WordPress RSS FRELIP Feed Integration |
| container_title | PLOS ONE |
| description | |
| discipline_display | Engineering & Technology |
| discipline_facet | Engineering & Technology |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:11097 |
| institution | FRELIP |
| journal_source_facet | PLOS ONE |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention Cybersecurity, Cryptography and Privacy Computer Science & IT Engineering & Technology |
| sub_discipline_display | Computer Science & IT |
| sub_discipline_facet | Computer Science & IT |
| subject_display | Cybersecurity, Cryptography and Privacy Computer Science & IT Engineering & Technology Cybersecurity, Cryptography and Privacy Computer Science & IT Engineering & Technology |
| subject_facet | Cybersecurity, Cryptography and Privacy Computer Science & IT Engineering & Technology |
| title | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention |
| title_auth | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention |
| title_full | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention |
| title_fullStr | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention |
| title_full_unstemmed | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention |
| title_short | A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention |
| title_sort | a hybrid system for detecting semiconductor wafer defects using modified mobilenet with multi-head attention |
| topic | Cybersecurity, Cryptography and Privacy Computer Science & IT Engineering & Technology |
| url | https://journals.plos.org/plosone/article?id=10.1371/journal.pone.0346595 |