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Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks
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| Published in: | IEEE Journal of the Electron Devices Society |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| Subjects: | |
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| _version_ | 1864030190392311814 |
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| collection | WordPress RSS FRELIP Feed Integration |
| container_title | IEEE Journal of the Electron Devices Society |
| description | |
| discipline_display | Technology & Engineering |
| discipline_facet | Technology & Engineering |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:31135 |
| institution | FRELIP |
| journal_source_facet | IEEE Journal of the Electron Devices Society |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks Electronics Technology & Engineering — Aerospace & Applied Tech Technology & Engineering |
| sub_discipline_display | Technology & Engineering — Aerospace & Applied Tech |
| sub_discipline_facet | Technology & Engineering — Aerospace & Applied Tech |
| subject_display | Electronics Technology & Engineering — Aerospace & Applied Tech Technology & Engineering Electronics Technology & Engineering — Aerospace & Applied Tech Technology & Engineering |
| subject_facet | Electronics Technology & Engineering — Aerospace & Applied Tech Technology & Engineering |
| title | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks |
| title_auth | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks |
| title_full | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks |
| title_fullStr | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks |
| title_full_unstemmed | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks |
| title_short | Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks |
| title_sort | repetitive gate-hbm-esd-induced vth degradation for rf gan hemt with matching networks |
| topic | Electronics Technology & Engineering — Aerospace & Applied Tech Technology & Engineering |
| url | http://ieeexplore.ieee.org/document/11352435 |