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Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection

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Published in:IEEE Access
Format: Online Article RSS Article
Published: 2026
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publishDate 2026
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spellingShingle Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
Computer Science & Information Science
Computer Science & IT
Engineering & Technology
sub_discipline_display Computer Science & IT
sub_discipline_facet Computer Science & IT
subject_display Computer Science & Information Science
Computer Science & IT
Engineering & Technology
Computer Science & Information Science
Computer Science & IT
Engineering & Technology
subject_facet Computer Science & Information Science
Computer Science & IT
Engineering & Technology
title Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
title_auth Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
title_full Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
title_fullStr Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
title_full_unstemmed Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
title_short Improving Electrical and Thermal Performance of 650-V GaN E-HEMT Modules Using a Cover-All Meandered Thick-Copper (CAMT) Interconnection
title_sort improving electrical and thermal performance of 650-v gan e-hemt modules using a cover-all meandered thick-copper (camt) interconnection
topic Computer Science & Information Science
Computer Science & IT
Engineering & Technology
url http://ieeexplore.ieee.org/document/11366226