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Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization
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| Published in: | Advanced Intelligent Systems |
|---|---|
| Format: | Online Article RSS Article |
| Published: |
2026
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| _version_ | 1867301678199341056 |
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| collection | WordPress RSS FRELIP Feed Integration |
| container_title | Advanced Intelligent Systems |
| description | |
| discipline_display | Artificial Intelligence |
| discipline_facet | Artificial Intelligence |
| format | Online Article RSS Article |
| genre | Journal Article |
| id | rss_article:83197 |
| institution | FRELIP |
| journal_source_facet | Advanced Intelligent Systems |
| publishDate | 2026 |
| publishDateSort | 2026 |
| record_format | rss_article |
| spellingShingle | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization Artificial Intelligence General Artificial Intelligence |
| sub_discipline_display | General |
| sub_discipline_facet | General |
| subject_display | Artificial Intelligence General Artificial Intelligence Artificial Intelligence General Artificial Intelligence |
| subject_facet | Artificial Intelligence General Artificial Intelligence |
| title | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization |
| title_auth | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization |
| title_full | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization |
| title_fullStr | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization |
| title_full_unstemmed | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization |
| title_short | Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization |
| title_sort | tandem neural network rapidly solves multivalued inverse problems: application to oxide‐semiconductor characterization |
| topic | Artificial Intelligence General Artificial Intelligence |
| url | https://advanced.onlinelibrary.wiley.com/doi/10.1002/aisy.70437?af=R |