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Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation

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Published in:IEEE Access
Format: Online Article RSS Article
Published: 2026
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container_title IEEE Access
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discipline_display Computer Sciience
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journal_source_facet IEEE Access
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publishDate 2026
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spellingShingle Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
Computer Sciience
General
Computer Sciience
sub_discipline_display General
sub_discipline_facet General
subject_display Computer Sciience
General
Computer Sciience
subject_facet Computer Sciience
General
Computer Sciience
title Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
title_alt Detección eficiente de defectos en micro-LED usando un YOLO podado con CBAM y aumento de reemplazo orientado a clases
Détection efficace de défauts de micro-LED utilisant un YOLO élagué avec CBAM et augmentation par remplacement orientée classe
Detecção Eficiente de Defeitos em Micro-LED Usando um YOLO Podado com CBAM e Aumento de Classe Orientado por Substituição
title_auth Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
title_es_txt Detección eficiente de defectos en micro-LED usando un YOLO podado con CBAM y aumento de reemplazo orientado a clases
title_fr_txt Détection efficace de défauts de micro-LED utilisant un YOLO élagué avec CBAM et augmentation par remplacement orientée classe
title_full Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
title_fullStr Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
title_full_unstemmed Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
title_pt_txt Detecção Eficiente de Defeitos em Micro-LED Usando um YOLO Podado com CBAM e Aumento de Classe Orientado por Substituição
title_short Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation
title_sort efficient micro-led defect detection using a pruned yolo with cbam and class-oriented replacement augmentation
topic Computer Sciience
General
Computer Sciience
url http://ieeexplore.ieee.org/document/11552627