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A Novel Design-for-Test flow using LibreLane

Design-for-testing is a crucial element of application-specific integrated circuit design, yet, in the nascent open-source electronic design automation scene, the solutions for it are sorely limited. Design-for-test-enabled chips allow defects to be caught early on in the manufacturing process, avoi...

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Bibliographic Details
Main Author: Gaber, Mohamed E
Format: Thesis
Published: AUC Knowledge Fountain 2026
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