Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
Design-for-testing is a crucial element of application-specific integrated circuit design, yet, in the nascent open-source electronic design automation scene, the solutions for it are sorely limited. Design-for-test-enabled chips allow defects to be caught early on in the manufacturing process, avoi...
| Main Author: | |
|---|---|
| Format: | Thesis |
| Published: |
AUC Knowledge Fountain
2026
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|