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Aspects of modelling and metrology in EMC

Thesis (M. Ing.) -- University of Stellenbosch, 1999.

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Bibliographic Details
Main Author:	Rütschlin, Marc
Other Authors:	Stellenbosch University. Faculty of . Dept. of .
Format:	Thesis
Language:	en_ZA
Published:	Stellenbosch : Stellenbosch University 2012
Subjects:	Electromagnetic compatibility Electromagnetic compatibility > Testing Dissertations > Electronic engineering
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Internet

http://hdl.handle.net/10019.1/51138