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Aspects of modelling and metrology in EMC
Thesis (M. Ing.) -- University of Stellenbosch, 1999.
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| Format: | Thesis |
| Language: | en_ZA |
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Stellenbosch : Stellenbosch University
2012
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| _version_ | 1867613926101876736 |
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| access_status_str | Open Access |
| author | Rütschlin, Marc |
| author2 | Stellenbosch University. Faculty of . Dept. of . |
| author_browse | Rütschlin, Marc Stellenbosch University. Faculty of . Dept. of . |
| author_facet | Stellenbosch University. Faculty of . Dept. of . Rütschlin, Marc |
| author_sort | Rütschlin, Marc |
| collection | Thesis |
| dc_rights_str_mv | Stellenbosch University |
| description | Thesis (M. Ing.) -- University of Stellenbosch, 1999. |
| format | Thesis |
| id | oai:scholar.sun.ac.za:10019.1/51138 |
| institution | Stellenbosch University (South Africa) |
| language | en_ZA |
| last_indexed | 2026-06-10T12:43:54.041Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository |
| publishDate | 2012 |
| publishDateRange | 2012 |
| publishDateSort | 2012 |
| publisher | Stellenbosch : Stellenbosch University |
| publisherStr | Stellenbosch : Stellenbosch University |
| record_format | dspace |
| source_str | SUNScholar — Stellenbosch University Repository |
| spelling | oai:scholar.sun.ac.za:10019.1/51138 Aspects of modelling and metrology in EMC Rütschlin, Marc Stellenbosch University. Faculty of . Dept. of . Electromagnetic compatibility Electromagnetic compatibility -- Testing Dissertations -- Electronic engineering Thesis (M. Ing.) -- University of Stellenbosch, 1999. Full text to be digitised and attached to bibliographic record. 2012-08-27T11:34:21Z 2012-08-27T11:34:21Z 1999 Thesis http://hdl.handle.net/10019.1/51138 en_ZA Stellenbosch University 130 p. : ill. Stellenbosch : Stellenbosch University |
| spellingShingle | Electromagnetic compatibility Electromagnetic compatibility -- Testing Dissertations -- Electronic engineering Rütschlin, Marc Aspects of modelling and metrology in EMC |
| title | Aspects of modelling and metrology in EMC |
| title_full | Aspects of modelling and metrology in EMC |
| title_fullStr | Aspects of modelling and metrology in EMC |
| title_full_unstemmed | Aspects of modelling and metrology in EMC |
| title_short | Aspects of modelling and metrology in EMC |
| title_sort | aspects of modelling and metrology in emc |
| topic | Electromagnetic compatibility Electromagnetic compatibility -- Testing Dissertations -- Electronic engineering |
| url | http://hdl.handle.net/10019.1/51138 |
| work_keys_str_mv | AT rutschlinmarc aspectsofmodellingandmetrologyinemc |