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The selection and single event upset testing of a DSP processor for a LEO satellite
Thesis (MScEng)--University of Stellenbosch, 2002.
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| Format: | Thesis |
| Language: | en_ZA |
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Stellenbosch : Stellenbosch University
2012
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| _version_ | 1867613910688858112 |
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| access_status_str | Open Access |
| author | Berner, Heiko |
| author2 | Blanckenberg, M. M. |
| author_browse | Berner, Heiko Blanckenberg, M. M. |
| author_facet | Blanckenberg, M. M. Berner, Heiko |
| author_sort | Berner, Heiko |
| collection | Thesis |
| dc_rights_str_mv | Stellenbosch University |
| description | Thesis (MScEng)--University of Stellenbosch, 2002. |
| format | Thesis |
| id | oai:scholar.sun.ac.za:10019.1/53171 |
| institution | Stellenbosch University (South Africa) |
| language | en_ZA |
| last_indexed | 2026-06-10T12:43:39.397Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository |
| publishDate | 2012 |
| publishDateRange | 2012 |
| publishDateSort | 2012 |
| publisher | Stellenbosch : Stellenbosch University |
| publisherStr | Stellenbosch : Stellenbosch University |
| record_format | dspace |
| source_str | SUNScholar — Stellenbosch University Repository |
| spelling | oai:scholar.sun.ac.za:10019.1/53171 The selection and single event upset testing of a DSP processor for a LEO satellite Berner, Heiko Blanckenberg, M. M. Stellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering. Signal processing -- Digital techniques Microprocessors -- Testing Electronic apparatus and appliances -- Effect of radiation on Dissertations -- Electrical and electronic engineering Theses -- Electrical and electronic engineering Thesis (MScEng)--University of Stellenbosch, 2002. ENGLISH ABSTRACT: After successful use of a DSP processor onboard the SUNSAT satellite, the need arose for a faster floating-point processor. A list of possible processors was generated from various selection criteria. Two suitable DSP processors were chosen, and because no radiation information was available for one of them, the decision was made to perform radiation tests on it. The procedures used to test the processor are described in detail so the same methods can be used for future radiation tests. An error detection and correction circuit was implemented to check and correct upsets in the on-chip memory of the DSP processor. This ensures that the processor code and data stays intact. AFRIKAANSE OPSOMMING: Na suksesvolle gebruik van 'n DSP verwerker aanboord die SUNSAT satelliet het die behoefte ontstaan vir 'n vinniger wissel-punt verwerker. 'n Lys van moontlike verwerkers is opgestel met die hulp van verskeie seleksie kriteria. Twee geskikte DSP verwerkers is gekies, en omdat geen radiasie informasie vir die een beskikbaar was nie, is besluit om radiasie toetse op hom te doen. Die prosedures gebruik om die verwerker te toets word deeglik beskryf sodat dieselfde metodes in die toekom gebruik kan word. 'n Fout deteksie en korreksie baan is geimplementeer om foute in die aanboord geheue van die DSP verwerker op te spoor en te korrigeer. Dit verseker dat die verwerker se kode en data intak bly. 2012-08-27T11:35:20Z 2012-08-27T11:35:20Z 2002-03 Thesis http://hdl.handle.net/10019.1/53171 en_ZA Stellenbosch University 180 p. : ill. application/pdf Stellenbosch : Stellenbosch University |
| spellingShingle | Signal processing -- Digital techniques Microprocessors -- Testing Electronic apparatus and appliances -- Effect of radiation on Dissertations -- Electrical and electronic engineering Theses -- Electrical and electronic engineering Berner, Heiko The selection and single event upset testing of a DSP processor for a LEO satellite |
| title | The selection and single event upset testing of a DSP processor for a LEO satellite |
| title_full | The selection and single event upset testing of a DSP processor for a LEO satellite |
| title_fullStr | The selection and single event upset testing of a DSP processor for a LEO satellite |
| title_full_unstemmed | The selection and single event upset testing of a DSP processor for a LEO satellite |
| title_short | The selection and single event upset testing of a DSP processor for a LEO satellite |
| title_sort | selection and single event upset testing of a dsp processor for a leo satellite |
| topic | Signal processing -- Digital techniques Microprocessors -- Testing Electronic apparatus and appliances -- Effect of radiation on Dissertations -- Electrical and electronic engineering Theses -- Electrical and electronic engineering |
| url | http://hdl.handle.net/10019.1/53171 |
| work_keys_str_mv | AT bernerheiko theselectionandsingleeventupsettestingofadspprocessorforaleosatellite AT bernerheiko selectionandsingleeventupsettestingofadspprocessorforaleosatellite |