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The selection and single event upset testing of a DSP processor for a LEO satellite

Thesis (MScEng)--University of Stellenbosch, 2002.

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Bibliographic Details
Main Author:	Berner, Heiko
Other Authors:	Blanckenberg, M. M.
Format:	Thesis
Language:	en_ZA
Published:	Stellenbosch : Stellenbosch University 2012
Subjects:	Signal processing > Digital techniques Microprocessors > Testing Electronic apparatus and appliances > Effect of radiation on Dissertations > Electrical and electronic engineering Theses > Electrical and electronic engineering
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