Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
Testing of leakage current failure in ASIC devices exposed to total ionizing dose environment using design for testability techniques
Due to the advancements in technology, electronic devices have been relied upon to operate under harsh conditions. Radiation is one of the main causes of different failures of the electronics devices. According to the operation environment, the sources of the radiation can be terrestrial or extra-te...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Published: |
AUC Knowledge Fountain
2020
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
Similar Items: Testing of leakage current failure in ASIC devices exposed to total ionizing dose environment using design for testability techniques
- A comprehensive comparison between design for testability techniques for total dose testing of flash-based FPGAs
- Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques
- Talent identification and development in South African professional football – a coach perspective
- Fault Modeling and Test Vector Generation for ASIC Devices Exposed to Space Single Event Environment
- Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment
- Nanostructured Cu-Zn Electrode Materials for Green Hydrogen Production