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Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment
Space radiation and nuclear reactors produce single event effects (SEE) in electronic circuits and impact their performance. The SEE phenomena cause circuits and electronic devices to fail by producing faulty results. Therefore, today’s circuit’s reliability is a significant concern for all circuit...
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| Format: | Thesis |
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AUC Knowledge Fountain
2022
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