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Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment
Space radiation and nuclear reactors produce single event effects (SEE) in electronic circuits and impact their performance. The SEE phenomena cause circuits and electronic devices to fail by producing faulty results. Therefore, today’s circuit’s reliability is a significant concern for all circuit...
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| Format: | Thesis |
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AUC Knowledge Fountain
2022
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| Summary: | Space radiation and nuclear reactors produce single event effects (SEE) in electronic circuits and impact their performance. The SEE phenomena cause circuits and electronic devices to fail by producing faulty results. Therefore, today’s circuit’s reliability is a significant concern for all circuit designers.
This thesis suggests a new automated flow to measure the single-event-transient (SET) effects in combinational circuits in application-specific integrated circuits (ASIC) while reaching full fault coverage. The developed flow characterizes the whole circuit nodes by identifying the most sensitive paths to the propagated SET pulses from the node under test to an observable primary output, causing single event upsets (SEUs).
The flow generates test vectors to reach the combinational circuit's highest possible fault coverage percentage. The generated test vectors guarantee that no logical masking for detected SET faults. Then, it analyzes each test vector independently to detect different sensitized paths possible for SET fault propagation. Then, the flow searches for the most sensitive path from the node under test to an observable primary output while measuring the minimal SET pulse characteristics that would produce SEUs. This approach also suggests a new enhanced metric is to identify which test vector enhances the propagated SET pulse within a combinational circuit, which is vital to find worst-case test vectors. |
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